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[IEEE 2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE) - Pasadena, CA, USA (2013.11.4-2013.11.7)] 2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE) - Quantifying software test process and product reliability simultaneously

✍ Scribed by Ikemoto, Shinya; Dohi, Tadashi; Okamura, Hiroyukii

Book ID: 121677025
Publisher: IEEE
Year: 2013
Weight: 616 KB
Category: Article
ISBN: 1479923664
DOI: 10.1109/ISSRE.2013.6698910

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