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[IEEE 2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology & Application (FENDT) - Jinan, China (2013.06.17-2013.06.20)] 2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology and Application - MFL inspection defect reconstruction based on self-learning PSO

✍ Scribed by Han, Wenhua; Xu, Jun; Tian, Guiyun

Book ID: 126751346
Publisher: IEEE
Year: 2013
Weight: 120 KB
Category: Article
ISBN: 1467360198
DOI: 10.1109/FENDT.2013.6635527

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