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[IEEE 2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology & Application (FENDT) - Jinan, China (2013.06.17-2013.06.20)] 2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology and Application - Eddy current imaging techniques for NDT&E applications

✍ Scribed by Cheng, Yuhua; Bai, Libing; Xiong, Xin; Wang, Taiping; Tian, Gui Yun

Book ID: 125447294
Publisher: IEEE
Year: 2013
Weight: 221 KB
Category: Article
ISBN: 1467360198
DOI: 10.1109/fendt.2013.6635537

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