[IEEE 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Nara, Japan (2013.12.15-2013.12.18)] 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models

✍ Scribed by Pues, Hugo; Brike, Ben; Gazda, Celina; Teichmann, Peter; Stijnen, Kristof; Peeters, Christian; Durier, Andre; Vande Ginste, Dries

• Book ID: 126757314
• Publisher: IEEE
• Year: 2013
• Weight: 433 KB
• Category: Article
• ISBN: 147992315X
• DOI: 10.1109/EMCCompo.2013.6735209