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[IEEE 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Nara, Japan (2013.12.15-2013.12.18)] 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI

✍ Scribed by Oliveira, C.; Benfica, J.; Bolzani Poehls, L. M.; Vargas, F.; Lipovetzky, J.; Lutenberg, A.; Gatti, E.; Hernandez, F.; Boyer, A.


Book ID
121657276
Publisher
IEEE
Year
2013
Weight
897 KB
Category
Article
ISBN
147992315X

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