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[IEEE 2013 36th International Spring Seminar on Electronics Technology (ISSE) - Alba Iulia, Romania (2013.05.8-2013.05.12)] Proceedings of the 36th International Spring Seminar on Electronics Technology - The power quality influence on the reliability of PFC capacitors

✍ Scribed by Tulbure, Adrian; Ceuca, Emilian; Farcas, Cristian; Farcas, Ioana

Book ID: 127293546
Publisher: IEEE
Year: 2013
Weight: 689 KB
Category: Article
ISBN: 1479900362
DOI: 10.1109/isse.2013.6648260

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