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[IEEE 2013 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Berlin, Germany (2013.09.25-2013.09.27)] 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Thermal transient characterization of semiconductor devices with multiple heat sources - Fundamentals for a new thermal standard

✍ Scribed by Schweitzer, Dirk

Book ID: 121483102
Publisher: IEEE
Year: 2013
Weight: 696 KB
Category: Article
ISBN: 1479922714
DOI: 10.1109/THERMINIC.2013.6675248

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