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[IEEE 2012 International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2012.11.11-2012.11.15)] The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems - Characterization and control of insulated gates for GaN power switching transistors

✍ Scribed by Hashizume, Tamotsu

Book ID: 120553817
Publisher: IEEE
Year: 2012
Weight: 993 KB
Category: Article
ISBN: 1467311960
DOI: 10.1109/ASDAM.2012.6418561

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