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[IEEE 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2012.09.19-2012.09.20)] 2012 International Conference on Actual Problems of Electron Devices Engineering - Fabrication of tunnel barrier by scanning probe lithography

✍ Scribed by Pavlova, A.Yu.; Khivintsev, Yu.V.; Filimonov, Yu.A.; Zaharov, A.A.; Tiercelin, N.; Pernod, P.

Book ID: 125435164
Publisher: IEEE
Year: 2012
Weight: 526 KB
Category: Article
ISBN: 1467320951
DOI: 10.1109/apede.2012.6478085

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