𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2012.09.19-2012.09.20)] 2012 International Conference on Actual Problems of Electron Devices Engineering - Memristor structures based on tunnel-thin organic dielectric and porous silicon layers

✍ Scribed by Bilenko, D.I.; Galushka, V.V.; Mysenko, I.B.; Terin, D.V.

Book ID: 121273074
Publisher: IEEE
Year: 2012
Weight: 353 KB
Category: Article
ISBN: 1467320951
DOI: 10.1109/APEDE.2012.6478098

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 International Conference on A

[IEEE 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2012.09.19-2012.09.20)] 2012 International Conference on Actual Problems of Electron Devices Engineering - Mobile handset antenna frequency band enlarging

✍ Grigoriev, A.D. 📂 Article 📅 2012 🏛 IEEE ⚖ 724 KB

[IEEE 2012 International Conference on A

[IEEE 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2012.09.19-2012.09.20)] 2012 International Conference on Actual Problems of Electron Devices Engineering - Fabrication of tunnel barrier by scanning probe lithography

✍ Pavlova, A.Yu.; Khivintsev, Yu.V.; Filimonov, Yu.A.; Zaharov, A.A.; Tiercelin, N 📂 Article 📅 2012 🏛 IEEE ⚖ 526 KB

[IEEE 2012 International Conference on A

[IEEE 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2012.09.19-2012.09.20)] 2012 International Conference on Actual Problems of Electron Devices Engineering - Modeling of complicated microwave devices by RFS code

✍ Grigoriev, A.D.; Salimov, R.V.; Tikhonov, R.I. 📂 Article 📅 2012 🏛 IEEE ⚖ 832 KB

[IEEE 2012 International Conference on A

[IEEE 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2012.09.19-2012.09.20)] 2012 International Conference on Actual Problems of Electron Devices Engineering - Dielectric materials' micriwave thermal treatment modelling using different types of radiators

✍ Kholopov, D.V.; Potapova, T.A.; Nefedov, V.N. 📂 Article 📅 2012 🏛 IEEE ⚖ 811 KB

[IEEE 2012 International Conference on A

[IEEE 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2012.09.19-2012.09.20)] 2012 International Conference on Actual Problems of Electron Devices Engineering - Propagation of plasmon waves in layer metal-dielectric structures with round cross section

✍ Shikhmatova, V.V.; Rozhnev, A.G. 📂 Article 📅 2012 🏛 IEEE ⚖ 479 KB

[IEEE 2012 International Conference on A

[IEEE 2012 International Conference on Actual Problems of Electron Devices Engineering (APEDE) - Saratov, Russia (2012.09.19-2012.09.20)] 2012 International Conference on Actual Problems of Electron Devices Engineering - Universal controlled electronic load for tests of highvoltage instrumentation

✍ Perevodshikov, V.I.; Sherbakov, A.V.; Truhachev, I.M.; Ybiennih, B.I. 📂 Article 📅 2012 🏛 IEEE ⚖ 579 KB