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[IEEE 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012 - Montreal, QC, Canada (2012.06.17-2012.06.22)] 2012 IEEE/MTT-S International Microwave Symposium Digest - Kahn envelope elimination and restoration technique using injection-locked oscillators

✍ Scribed by Chi-Tsan Chen, ; Yi-Chieh Lin, ; Tzyy-Sheng Horng, ; Kang-Chun Peng, ; Chien-Jung Li,

Book ID: 121260537
Publisher: IEEE
Year: 2012
Weight: 885 KB
Category: Article
ISBN: 1467310867
DOI: 10.1109/MWSYM.2012.6259777

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