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[IEEE 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012 - Montreal, QC, Canada (2012.06.17-2012.06.22)] 2012 IEEE/MTT-S International Microwave Symposium Digest - Rugged and reliable ohmic MEMS switches

✍ Scribed by Maciel, John; Majumder, Sumit; Lampen, James; Guthy, Charles

Book ID: 126693751
Publisher: IEEE
Year: 2012
Weight: 805 KB
Category: Article
ISBN: 1467310867
DOI: 10.1109/MWSYM.2012.6258368

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