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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Experimental thermal resistance evaluation of a three-dimensional (3D) chip stack, including the transient measurements

✍ Scribed by Matsumoto, Keiji; Ibaraki, Soichiro; Sueoka, Kuniaki; Sakuma, Katsuyuki; Kikuchi, Hidekazu; Orii, Yasumitsu; Yamada, Fumiaki

Book ID: 115525711
Publisher: IEEE
Year: 2012
Weight: 391 KB
Volume: 0
Category: Article
ISBN: 146731109X
DOI: 10.1109/stherm.2012.6188819

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