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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - A memory yield improvement scheme combining built-in self-repair and error correction codes

✍ Scribed by Wu, Tze-Hsin; Chen, Po-Yuan; Lee, Mincent; Lin, Bin-Yen; Wu, Cheng-Wen; Tien, Chen-Hung; Lin, Hung-Chih; Chen, Hao; Peng, Ching-Nen; Wang, Min-Jer

Book ID: 120591808
Publisher: IEEE
Year: 2012
Weight: 439 KB
Category: Article
ISBN: 1467315931
DOI: 10.1109/TEST.2012.6401576

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