𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - DART: Dependable VLSI test architecture and its implementation

✍ Scribed by Sato, Yasuo; Kajihara, Seiji; Yoneda, Tomokazu; Hatayama, Kazumi; Inoue, Michiko; Miura, Yukiya; Untake, Satosni; Hasegawa, Takumi; Sato, Motoyuki; Shimamura, Kotaro

Book ID: 120203836
Publisher: IEEE
Year: 2012
Weight: 986 KB
Category: Article
ISBN: 1467315931
DOI: 10.1109/TEST.2012.6401581

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE International Test Confe

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - FPGA-based synthetic instrumentation for board test

✍ Aleksejev, Igor; Jutman, Artur; Devadze, Sergei; Odintsov, Sergei; Wenzel, Thoma 📂 Article 📅 2012 🏛 IEEE ⚖ 937 KB

[IEEE 2012 IEEE International Test Confe

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - On modeling faults in FinFET logic circuits

✍ Liu, Yuxi; Xu, Qiang 📂 Article 📅 2012 🏛 IEEE ⚖ 554 KB

[IEEE 2012 IEEE International Test Confe

[IEEE 2012 IEEE International Test Conference (ITC 2012 ) - Anaheim, CA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - On-chip diagnosis for early-life and wear-out failures

✍ Beckler, M.; Blanton, R. D. 📂 Article 📅 2012 🏛 IEEE ⚖ 470 KB

[IEEE 2012 IEEE International Test Confe

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - BS 1149.1 extensions for an online interconnect fault detection and recovery

✍ Sadeghi-Kohan, Somayeh; Namaki-Shoushtari, Majid; Javaheri, Fatemeh; Navabi, Zai 📂 Article 📅 2012 🏛 IEEE ⚖ 435 KB

[IEEE 2012 IEEE International Test Confe

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - A memory yield improvement scheme combining built-in self-repair and error correction codes

✍ Wu, Tze-Hsin; Chen, Po-Yuan; Lee, Mincent; Lin, Bin-Yen; Wu, Cheng-Wen; Tien, Ch 📂 Article 📅 2012 🏛 IEEE ⚖ 439 KB

[IEEE 2012 IEEE International Test Confe

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Impact of Radial defect clustering on 3D stacked IC yield from wafer to wafer stacking

✍ Singh, Eshan 📂 Article 📅 2012 🏛 IEEE ⚖ 397 KB