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[IEEE 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012 - Pittsburgh, PA, USA (2012.08.6-2012.08.10)] 2012 IEEE International Symposium on Electromagnetic Compatibility - Feasibility of fault analysis based on intentional electromagnetic interference

✍ Scribed by Takahashi, Junko; Hayashi, Yu-ichi; Homma, Naofumi; Fuji, Hitoshi; Aoki, Takafumi

Book ID: 121235628
Publisher: IEEE
Year: 2012
Weight: 323 KB
Category: Article
ISBN: 1467320595
DOI: 10.1109/ISEMC.2012.6351665

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