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[IEEE 2012 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2012.05.30-2012.06.1)] 2012 IEEE International Conference on IC Design & Technology - Energy efficiency deterioration by variability in SRAM and circuit techniques for energy saving without voltage reduction

✍ Scribed by Kawasumi, A.; Takeyama, Y.; Hirabayashi, O.; Kushida, K.; Tachibana, F.; Niki, Y.; Sasaki, S.; Yabe, T.

Book ID: 121255733
Publisher: IEEE
Year: 2012
Weight: 790 KB
Category: Article
ISBN: 1467301442
DOI: 10.1109/ICICDT.2012.6232859

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