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[IEEE 2012 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2012.05.30-2012.06.1)] 2012 IEEE International Conference on IC Design & Technology - Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component

โœ Scribed by Mitani, Y.; Fukatsu, S.; Hagishima, D.; Matsuzawa, K.


Book ID
120043061
Publisher
IEEE
Year
2012
Weight
842 KB
Category
Article
ISBN
1467301442

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