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[IEEE 2012 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2012.05.30-2012.06.1)] 2012 IEEE International Conference on IC Design & Technology - Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications

โœ Scribed by Franco, J.; Kaczer, B.; Mitard, J.; Toledano-Luque, M.; Crupi, F.; Eneman, G.; Rousse, Ph. J.; Grasser, T.; Cho, M.; Kauerauf, T.; Witters, L.; Hellings, G.; Ragnarsson, L.-A; Horiguchi, N.; Heyns, M.; Groeseneken, G.


Book ID
120067607
Publisher
IEEE
Year
2012
Weight
997 KB
Category
Article
ISBN
1467301442

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