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[IEEE 2012 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Bangkok, Thailand (2012.12.3-2012.12.5)] 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC) - The sensitivity analysis of the effect of single-event-upset on low-swing signaling driver

✍ Scribed by Mahyuddin, Nor Muzlifah; Russell, Gordon

Book ID: 120203089
Publisher: IEEE
Year: 2012
Weight: 229 KB
Category: Article
ISBN: 1467356956
DOI: 10.1109/EDSSC.2012.6482817

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