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[IEEE 2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - La Jolla, CA, USA (2012.10.14-2012.10.17)] 2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - GaN HEMT Junction Temperature Dependence on Diamond Substrate Anisotropy and Thermal Boundary Resistance

✍ Scribed by Nochetto, Horacio C.; Jankowski, Nicholas R.; Bar-Cohen, Avram

Book ID: 120085349
Publisher: IEEE
Year: 2012
Weight: 249 KB
Category: Article
ISBN: 1467309273
DOI: 10.1109/CSICS.2012.6340106

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