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[IEEE 2012 IEEE 18th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Alba Iulia, Romania (2012.10.25-2012.10.28)] 2012 IEEE 18th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Software in the Loop environment reliability for testing embedded code

✍ Scribed by Muresan, Marius; Pitica, Dan

Book ID: 121190340
Publisher: IEEE
Year: 2012
Weight: 542 KB
Category: Article
ISBN: 1467347574
DOI: 10.1109/SIITME.2012.6384402

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