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[IEEE 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Bangalore, India (2012.07.24-2012.07.28)] 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials - An Attempt to Investigate the Transformer Failure by using DGA and SFRA Analysis

✍ Scribed by Patil, Shubhangi S; Chaudhari, Sushil E

Book ID: 121237708
Publisher: IEEE
Year: 2012
Weight: 994 KB
Category: Article
ISBN: 1467328502
DOI: 10.1109/ICPADM.2012.6318985

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