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[IEEE 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Bangalore, India (2012.07.24-2012.07.28)] 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials - Application of neural networks for transformer fault diagnosis

✍ Scribed by Venkatasami, A.; Latha, P.; Kasirajan, K.

Book ID: 118010432
Publisher: IEEE
Year: 2012
Weight: 791 KB
Category: Article
ISBN: 1467328502
DOI: 10.1109/icpadm.2012.6318975

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