𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Test pin count reduction for NoC-based Test delivery in multicore SOCs

✍ Scribed by Richter, M.; Chakrabarty, K.

Book ID: 120826832
Publisher: IEEE
Year: 2012
Weight: 230 KB
Category: Article
ISBN: 3981080181
DOI: 10.1109/DATE.2012.6176601

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 Design, Automation & Test in

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Design for test and reliability in ultimate CMOS

✍ Nicolaidis, M.; Anghel, L.; Zergainoh, N-E; Zorian, Y.; Karnik, T.; Bowman, K.; 📂 Article 📅 2012 🏛 IEEE ⚖ 202 KB

[IEEE 2012 Design, Automation & Test in

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Post-synthesis leakage power minimization

✍ Rahman, M.; Sechen, C. 📂 Article 📅 2012 🏛 IEEE ⚖ 251 KB

[IEEE 2012 Design, Automation & Test in

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Beyond CMOS - benchmarking for future technologies

✍ Sotomayor Torres, C. M.; Ahopelto, J.; Graef, M. W. M.; Popp, R. M.; Rosenstiel, 📂 Article 📅 2012 🏛 IEEE ⚖ 559 KB

[IEEE 2012 Design, Automation & Test in

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Memristor technology in future electronic system design

✍ Tetzlaff, R.; Bruening, A. 📂 Article 📅 2012 🏛 IEEE ⚖ 126 KB

[IEEE 2012 Design, Automation & Test in

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Generating instruction streams using abstract CSP

✍ Katz, Y.; Rimon, M.; Ziv, A. 📂 Article 📅 2012 🏛 IEEE ⚖ 98 KB

[IEEE 2012 Design, Automation & Test in

[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Embedded systems and software challenges in electric vehicles

✍ Chakraborty, S.; Lukasiewycz, M.; Buckl, C.; Fahmy, S.; Naehyuck Chang, ; Sangyo 📂 Article 📅 2012 🏛 IEEE ⚖ 468 KB