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[IEEE 2012 6th International Conference on Software Security and Reliability (SERE) - Gaithersburg, MD, USA (2012.06.20-2012.06.22)] 2012 IEEE Sixth International Conference on Software Security and Reliability - An Embedded Software Reliability Model with Consideration of Hardware Related Software Failures

✍ Scribed by Park, Jinhee; Kim, Hyeon-Jeong; Shin, Ju-Hwan; Baik, Jongmoon

Book ID: 120475556
Publisher: IEEE
Year: 2012
Weight: 509 KB
Category: Article
ISBN: 0769547427
DOI: 10.1109/SERE.2012.10

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