[IEEE 2012 6th International Conference on Software Security and Reliability (SERE) - Gaithersburg, MD, USA (2012.06.20-2012.06.22)] 2012 IEEE Sixth International Conference on Software Security and Reliability - On the Effective Use of Security Test Patterns

✍ Scribed by Smith, Ben; Williams, Laurie

• Book ID: 120266177
• Publisher: IEEE
• Year: 2012
• Weight: 647 KB
• Category: Article
• ISBN: 0769547427
• DOI: 10.1109/SERE.2012.23