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[IEEE 2012 28th International Conference on Microelectronics (MIEL 2012) - Nis, Serbia (2012.05.13-2012.05.16)] 2012 28th International Conference on Microelectronics Proceedings - Analytical unified drain current model of long-channel tri-gate FinFETs

✍ Scribed by Tsormpatzoglou, A.; Fasarakis, N.; Tassis, D. H.; Pappas, I.; Papathanasiou, K.; Dimitriadis, C. A.

Book ID: 123608924
Publisher: IEEE
Year: 2012
Weight: 230 KB
Category: Article
ISBN: 1467302368
DOI: 10.1109/MIEL.2012.6222810

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