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[IEEE 2012 28th International Conference on Microelectronics (MIEL 2012) - Nis, Serbia (2012.05.13-2012.05.16)] 2012 28th International Conference on Microelectronics Proceedings - Recent developments in understanding the bias temperature instability

✍ Scribed by Grasser, T.; Kaczer, B.; Reisinger, H.; Wagner, P.-J.; Toledano-Luque, M.

Book ID: 118166322
Publisher: IEEE
Year: 2012
Weight: 413 KB
Category: Article
ISBN: 1467302368
DOI: 10.1109/miel.2012.6222864

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