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[IEEE 2012 25th International Conference on VLSI Design - Hyderabad, India (2012.01.7-2012.01.11)] 2012 25th International Conference on VLSI Design - A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection

✍ Scribed by Kundu, Subhadip; Chattopadhyay, Santanu; Sengupta, Indranil; Kapur, Rohit

Book ID: 124157059
Publisher: IEEE
Year: 2012
Weight: 203 KB
Category: Article
ISBN: 0769546382
DOI: 10.1109/VLSID.2012.110

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