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[IEEE 2012 25th International Conference on VLSI Design - Hyderabad, India (2012.01.7-2012.01.11)] 2012 25th International Conference on VLSI Design - Analysis of the Pull-In Phenomenon in Microelectromechanical Varactors

✍ Scribed by Roy, Anindya Lal; Bhattacharya, Anirban; Chaudhuri, Ritesh Ray; Bhattacharyya, Tarun Kanti

Book ID: 121207057
Publisher: IEEE
Year: 2012
Weight: 330 KB
Category: Article
ISBN: 0769546382
DOI: 10.1109/VLSID.2012.68

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