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[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - A design-for-test apparatus for measuring on-chip temperature with fine granularity

✍ Scribed by Tandon, James S.; Sasaki, Masahiro; Ikeda, Makoto; Asada, Kunihiro

Book ID: 118036984
Publisher: IEEE
Year: 2012
Weight: 510 KB
Volume: 0
Category: Article
ISBN: 1467310352
DOI: 10.1109/isqed.2012.6187470

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