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[IEEE 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Grenoble, France (2012.03.6-2012.03.7)] 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Comparison between low and high read bias in FB-RAM on UTBOX FDSOI devices

✍ Scribed by Almeida, L. M.; Aoulaiche, M.; Sasaki, K. R. A.; Nicoletti, T.; de Andrade, M. G. C.; Collaert, N.; Simoen, E.; Claeys, C.; Martino, J. A.; Jurczak, M.

Book ID: 118184620
Publisher: IEEE
Year: 2012
Weight: 231 KB
Volume: 0
Category: Article
ISBN: 1467301906
DOI: 10.1109/ulis.2012.6193357

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