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[IEEE 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Grenoble, France (2012.03.6-2012.03.7)] 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - The impact of gate length scaling on UTBOX FDSOI devices: The digital/analog performance of extension-less structures

✍ Scribed by Nicoletti, T.; Santos, S.; Almeida, L.; Martino, J. A.; Aoulaiche, M.; Veloso, A.; Jurczak, M.; Simoen, E.; Claeys, C.

Book ID: 118181632
Publisher: IEEE
Year: 2012
Weight: 164 KB
Volume: 0
Category: Article
ISBN: 1467301906
DOI: 10.1109/ulis.2012.6193372

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