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[IEEE 2011 Tenth International Conference on Machine Learning and Applications (ICMLA) - Honolulu, HI, USA (2011.12.18-2011.12.21)] 2011 10th International Conference on Machine Learning and Applications and Workshops - Feature Selection Metric Using AUC Margin for Small Samples and Imbalanced Data Classification Problems

✍ Scribed by Alshawabkeh, Malak; Aslam, Javed A.; Dy, Jennifer; Kaeli, David

No coin nor oath required. For personal study only.

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