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[IEEE 2009 International Conference on Machine Learning and Applications (ICMLA) - Miami, FL, USA (2009.12.13-2009.12.15)] 2009 International Conference on Machine Learning and Applications - Feature Selection with Imbalanced Data for Software Defect Prediction

✍ Scribed by Khoshgoftaar, Taghi M.; Gao, Kehan

Book ID: 118057558
Publisher: IEEE
Year: 2009
Weight: 196 KB
Volume: 0
Category: Article
ISBN: 0769539262
DOI: 10.1109/icmla.2009.18

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