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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - A high current efficiency rail-to-rail buffer for low drop-out regulators with load regulation-enhanced

✍ Scribed by Peng, Guang-Yu; Wei, Kai-Cheng

Book ID: 121217521
Publisher: IEEE
Year: 2011
Weight: 355 KB
Category: Article
ISBN: 1424485002
DOI: 10.1109/VDAT.2011.5783550

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