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[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - Thickness measurement of nano-metallic film with electromagnetic sensor under large sensor-sample distance

✍ Scribed by Zhao, Qian; Yu, Qiang; Qu, Ziliian; Si, Lina; Lu, Xinchun; Meng, Yonggang

Book ID: 124165647
Publisher: IEEE
Year: 2011
Weight: 209 KB
Category: Article
ISBN: 1424479339
DOI: 10.1109/IMTC.2011.5944268

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