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[IEEE 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Berlin, Germany (2011.03.21-2011.03.25)] 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops - Model Driven Mutation Applied to Adaptative Systems Testing

✍ Scribed by Bartel, Alexandre; Baudry, Benoit; Munoz, Freddy; Klein, Jacques; Mouelhi, Tejeddine; Le Traon, Yves

Book ID: 121496030
Publisher: IEEE
Year: 2011
Weight: 277 KB
Category: Article
ISBN: 1457700190
DOI: 10.1109/ICSTW.2011.24

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