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[IEEE 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Berlin, Germany (2011.03.21-2011.03.25)] 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops - Risk-Based Testing of Safety-Critical Embedded Systems Driven by Fault Tree Analysis

✍ Scribed by Kloos, Johannes; Hussain, Tanvir; Eschbach, Robert

Book ID: 120450498
Publisher: IEEE
Year: 2011
Weight: 370 KB
Category: Article
ISBN: 1457700190
DOI: 10.1109/ICSTW.2011.90

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