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[IEEE 2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - Waikoloa, HI, USA (2011.10.16-2011.10.19)] 2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - A Phased Array RFIC with Built-In Self-Test Using an Integrated Vector Signal Analyzer

✍ Scribed by Inac, Ozgur; Shin, Donghyup; Rebeiz, Gabriel M.

Book ID: 120041572
Publisher: IEEE
Year: 2011
Weight: 868 KB
Category: Article
ISBN: 1612847110
DOI: 10.1109/CSICS.2011.6062488

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