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[IEEE 2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - Waikoloa, HI, USA (2011.10.16-2011.10.19)] 2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - A 122 GHz Multiprobe Reflectometer for Dielectric Sensor Readout in SiGe BiCMOS Technology

✍ Scribed by Laemmle, Benjamin; Schmalz, Klaus; Scheytt, Christoph; Kissinger, Dietmar; Weigel, Robert

Book ID: 118255322
Publisher: IEEE
Year: 2011
Weight: 405 KB
Volume: 0
Category: Article
ISBN: 1612847110
DOI: 10.1109/csics.2011.6062487

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