[IEEE 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Atlanta, GA, USA (2011.10.9-2011.10.11)] 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Characterization and modeling of SiGe HBT low-frequency noise in inverse operating condition

[IEEE 2011 IEEE Bipolar/BiCMOS Circuits

✍ Li, Yan; Wu, Ruili; Lopez, Jerry; Lie, Donald Y.C. 📂 Article 📅 2011 🏛 IEEE ⚖ 573 KB

[IEEE 2011 IEEE Bipolar/BiCMOS Circuits

✍ Magnee, P.H.C.; van Dalen, R.; Mertens, H.; Vanhoucke, T.; van Velzen, B.; Huisk 📂 Article 📅 2011 🏛 IEEE ⚖ 715 KB

[IEEE 2011 IEEE Bipolar/BiCMOS Circuits

✍ Fox, A.; Heinemann, B.; Barth, R.; Marschmeyer, S.; Wipf, Ch.; Yamamoto, Y. 📂 Article 📅 2011 🏛 IEEE ⚖ 212 KB

[IEEE 2011 IEEE Bipolar/BiCMOS Circuits

✍ Van Huylenbroeck, S.; Sibaja-Hernandez, A.; Venegas, R.; You, S.; Vleugels, F.; 📂 Article 📅 2011 🏛 IEEE ⚖ 337 KB

[IEEE 2011 IEEE Bipolar/BiCMOS Circuits

✍ Aufinger, Klaus; Knapp, Herbert; Boguth, Sabine; Gerasika, Oleksiy; Lachner, Rud 📂 Article 📅 2011 🏛 IEEE ⚖ 916 KB

[IEEE 2011 IEEE Bipolar/BiCMOS Circuits

✍ Vanhoucke, T.; Klaassen, D.B.M.; Mertens, H.; Donkers, J.J.T.M.; Hurkx, G.A.M; H 📂 Article 📅 2011 🏛 IEEE ⚖ 365 KB