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[IEEE 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Atlanta, GA, USA (2011.10.9-2011.10.11)] 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - SiGe:C profile optimization for low noise performance

✍ Scribed by Magnee, P.H.C.; van Dalen, R.; Mertens, H.; Vanhoucke, T.; van Velzen, B.; Huiskamp, P.; Brunets, I.; Donkers, J.J.T.M.; Klaassen, D.B.M.

Book ID: 127288149
Publisher: IEEE
Year: 2011
Weight: 715 KB
Category: Article
ISBN: 1612841643
DOI: 10.1109/bctm.2011.6082773

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