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[IEEE 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Atlanta, GA, USA (2011.10.9-2011.10.11)] 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Integration of isolated RF-LDMOS transistors in a 0.25 µm SiGe:C BICMOS process

✍ Scribed by Sorge, R.; Fischer, A.; Schmidt, J.; Wipf, C.; Barth, R.; Pliquett, R.


Book ID
120067587
Publisher
IEEE
Year
2011
Weight
98 KB
Category
Article
ISBN
1612841643

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