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[IEEE 2011 IEEE 6th International Design and Test Workshop (IDT) - Beirut, Lebanon (2011.12.11-2011.12.14)] 2011 IEEE 6th International Design and Test Workshop (IDT) - Yield enhancement flow for analog and full custom designs reliability-rules automatic application

✍ Scribed by Abdulghany, Ahmad; Fathy, Rami; Capodieci, Luigi; Malik, Shobhit

Book ID: 126764663
Publisher: IEEE
Year: 2011
Weight: 839 KB
Category: Article
ISBN: 1467304670
DOI: 10.1109/IDT.2011.6123105

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