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[IEEE 2011 IEEE 6th International Design and Test Workshop (IDT) - Beirut, Lebanon (2011.12.11-2011.12.14)] 2011 IEEE 6th International Design and Test Workshop (IDT) - The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits

✍ Scribed by Hamieh, Layla; Mehdi, Nader; Omeirat, Ghazalah; Chehab, Ali; Kayssi, Ayman

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