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[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Electrical characterization of silicon nanowire p-i-n diodes arrays with varying diameters

✍ Scribed by Sun, Yongshun; Yu, Mingbin; Rusli,

Book ID: 115445875
Publisher: IEEE
Year: 2011
Weight: 615 KB
Volume: 0
Category: Article
ISBN: 1457703793
DOI: 10.1109/inec.2011.5991625

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