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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating

✍ Scribed by Moghaddam, Elham K.; Rajski, Janusz; Reddy, Sudhakar M.; Janicki, Jakub

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