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[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Unidirectional error detection, localization and correction for DRAMs: Application to on-line DRAM repair strategies

✍ Scribed by Madalin, Neagu; Miclea, Liviu; Figueras, Joan

Book ID: 126999704
Publisher: IEEE
Year: 2011
Weight: 611 KB
Category: Article
ISBN: 1457710536
DOI: 10.1109/iolts.2011.5994540

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